Topic
data scarcity
Artificial Intelligence #defect classification#scanning tunneling microscopy
AI Method Overcomes Labelled Data Scarcity for Defect Classification in STM
Scanning tunneling microscopy image analysis traditionally requires extensive manual labeling. A new approach combines few-shot learning and unsupervised learning to automate defect classification, achieving high accuracy on multiple surfaces with minimal labelled data. The model can adapt to unseen surfaces with as few as one additional data point.
Jun 20, 2026 1 source
Artificial Intelligence #intelligent fault diagnosis#data scarcity
Leveraging Non-Linearity to Overcome Data Scarcity in Intelligent Fault Diagnosis Systems
A new research paper proposes a method to design Intelligent Fault Diagnosis Systems under strong data scarcity by leveraging intrinsic non-linearities of systems. The approach uses a periodic multi-excitation level procedure and pre-trained Convolutional Neural Networks, validated on a railway pantograph structure.
Jun 20, 2026 1 source