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defect classification

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AI Method Overcomes Labelled Data Scarcity for Defect Classification in STM Technology
Artificial Intelligence #defect classification#scanning tunneling microscopy

AI Method Overcomes Labelled Data Scarcity for Defect Classification in STM

Scanning tunneling microscopy image analysis traditionally requires extensive manual labeling. A new approach combines few-shot learning and unsupervised learning to automate defect classification, achieving high accuracy on multiple surfaces with minimal labelled data. The model can adapt to unseen surfaces with as few as one additional data point.

Jun 20, 2026 1 source